Development of Heating/Drawing Device for in situ X-Ray Diffraction Measurement of Polymer Films during Uniaxial Drawing

Syozo MURAKAMI

Institute for Chemical Research, Kyoto University; Uji-shi 611-0011 Japan

The heating/drawing device was designed and constructed for in situ X-ray diffraction measurements of polymer films and fibers using Imaging Plates system. The specimen is elongated from both sides so that the irradiating part of the specimen can be kept position during the elongation. It is also possible to measure the stress and the X-ray diffraction simultaneously. The crystal phase transition of an extruded-blown polyethylene film during the drawing process and the development of crystalline structure in the poly(ethylene 2,6-naphthalate) film are presented.

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